发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having satisfactory high frequency characteristics such as high-frequency amplification factor, noise characteristic, etc. SOLUTION: This device comprises a first conductivity-type (p-type) semiconductor substrate 1, a second conductivity-type (n+-type) source regions 4 disposed on the p-type substrate 1, a second conductivity-type (n+-type) drain regions 5 distant from the source regions 4 on the p-type substrate 1 surface, gate electrodes 7 disposed via a first (gate) insulation film 6 between the source regions 4 and the drain regions 5 on the p-type substrate 1, and a conductive shield film 13 disposed via a second (interlayer) insulation film 9 on at least the source regions 4 and the gate electrodes 7 and connected to the ground potential.
申请公布号 JP2000357692(A) 申请公布日期 2000.12.26
申请号 JP19990168774 申请日期 1999.06.15
申请人 TOSHIBA CORP 发明人 KINOSHITA YOSHIHIRO
分类号 H01L23/52;H01L21/3205;H01L29/78;H03F3/193;(IPC1-7):H01L21/320 主分类号 H01L23/52
代理机构 代理人
主权项
地址