| 摘要 |
According to the present invention, a test device is capable of testing an electronic component by receiving an image of each side of the electronic component on each of multiple tracks, formed on a rotating glass plate, by arranging the electronic component on each of the tracks. The test device includes: a moving unit moving the electronic component, supplied through a hopper, to each of the tracks to test the electronic component; a rotating unit rotating the glass plate on which the electronic component placed; an arranging unit arranging the electronic component in a line to conduct an accurate test on the electronic component rotated by the rotating unit; an image obtaining unit obtaining the shape of each side of the electronic component arranged through the arranging unit; and a detecting unit detecting whether the electronic component, obtained from the image obtaining unit, is normal or defective. The image obtaining unit includes: a first image obtaining unit installed in a rotating direction of the glass plate, and obtaining the upper and outer sides of the electronic component at the same time or separately; and a second image obtaining unit obtaining the lower side of the electronic component. Therefore, with a minimum number of image obtaining units, all the sides of the electronic component are obtained. According to the present invention, as the number of image sensors is reduced, every side of the electronic component is obtained at the same time with two or three image sensors. |
