| 摘要 |
A testing head for a test equipment of electronic devices comprises a plurality of contact probes inserted into guiding holes made in at least one upper guide and in a lower guide, separate from one another by an air zone, the contact probes comprising at least one enlarged portion suitable for preventing the escape of such probes from the guiding holes. Conveniently, the enlarged portions of the contact probes adjacent according to a direction of distribution of contact pads of an integrated device to be tested have respective larger sides orthogonal to one another. |
