| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an analyzing method of an X-ray absorbing fine structure capable of reducing the noise of an X-ray absorption spectrum, facilitating the analysis of data and capable of enhancing analytic precision, and its analyzer. <P>SOLUTION: In the analyzing method of the X-ray absorbing fine structure for analyzing the X-ray absorbing fine structure of a sample 13 by spectrally diffracting X-rays by a polychromater to irradiate the sample 13 with spectrally diffracted X-rays, vibration is applied to the sample 13 in a measuring time by an ultrasonic generator 7. By this constitution, even in a case that the thickness or density of the sample 13 is easy to become non-uniform, the vibration is applied to the sample 13 in the measuring time to average the noise of the obtained X-ray absorption spectrum of the sample 13. Accordingly, the noise of the X-ray absorption spectrum can be reduced and, as a result, the analysis of data is facilitated and the precision of the analyzing method of the X-ray absorbing fine structure can be enhanced. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
