发明名称 INSPECTION PARAMETER SETTING SUPPORT DEVICE, CONTROL PROGRAM THEREFOR, AND CONTROL METHOD
摘要 PROBLEM TO BE SOLVED: To accurately and easily inspect the quality of a mounting state of mounted components on a high-density mounting board. SOLUTION: A device includes an image data acquisition part 12 for acquiring image data, an analysis domain extraction part 14 for extracting image data on a plurality of object mounted components respectively from the acquired image data, a histogram formation part 15 for forming a pixel value histogram of each light having each different color relative to each of the plurality of mounted components from each extracted piece of the image data, and a histogram analysis part 16 and a variation dividing processing part 18 for classifying the plurality of mounted components into each mounted component group utilizing the same inspection parameter corresponding to a difference between each of the plurality of mounted components in each piece of generated distribution data. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008209320(A) 申请公布日期 2008.09.11
申请号 JP20070048099 申请日期 2007.02.27
申请人 OMRON CORP 发明人 ONISHI TAKAKO
分类号 G01N21/956;H05K3/34 主分类号 G01N21/956
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