发明名称 DEFECT DETECTION PROCESSING SYSTEM, DEFECT DETECTION PROCESSING SYSTEM AND DEFECT DETECTION PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a defect detection processing system capable of easily performing inspection of a deep part for detecting internal defect of an inspection object.SOLUTION: The defect detection processing system includes an acquisition section, a detection section and an output section. The acquisition section acquires temperature of an inspection object. The detection section detects temperature changes between a first temperature of the inspection object before supplying a liquid to the surface of the inspection object and a second temperature of the inspection object after supplying the liquid to the surface. The output section extracts a piece of information representing a defect of the inspection object based on the detected temperature changes and outputs the same.SELECTED DRAWING: Figure 3
申请公布号 JP2016156747(A) 申请公布日期 2016.09.01
申请号 JP20150035798 申请日期 2015.02.25
申请人 TOSHIBA CORP 发明人 TAKAHASHI MASAO
分类号 G01N25/72 主分类号 G01N25/72
代理机构 代理人
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