| 摘要 |
A slide member including a base material; and an overlay that is formed over the base material and that consists of Ag or Ag alloy including crystal planes (hk1) represented by Miller indices; wherein a relative X-ray diffraction intensity of crystal plane (200) to a sum of X-ray diffraction intensities of crystal planes (200), (111), (220), (311), and (222) of the overlay ranges between 1%≰(200)/{(200)+(111)+(220)+(311)+(222)}≰20% and the relative X-ray diffraction intensity of the crystal plane (200) to the X-ray diffraction intensity of the crystal plane (111) ranges between 1%≰(200)/(111)≰30%.
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