发明名称 |
Reducing MEMS stiction by deposition of nanoclusters |
摘要 |
Certain microelectromechanical systems (MEMS) devices, and methods of creating them, are disclosed. The method may include forming a structural layer over a substrate; forming a mask layer over the structural layer, wherein the mask layer is formed with a material selective to an etching process; forming a plurality of nanoclusters on the mask layer; and etching the structural layer using at least the etching process. |
申请公布号 |
US9434602(B2) |
申请公布日期 |
2016.09.06 |
申请号 |
US201414446910 |
申请日期 |
2014.07.30 |
申请人 |
Freescale Semiconductor, Inc. |
发明人 |
Steimle Robert F.;Montez Ruben B. |
分类号 |
B81B3/00;B81C1/00 |
主分类号 |
B81B3/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a microelectromechanical systems (MEMS) device, the method comprising:
forming a structural layer over a substrate; forming a mask layer over the structural layer, wherein the mask layer is formed with a material selective to an etching process; forming a plurality of nanoclusters on the mask layer; using the nanoclusters as a mask for removing portions of the mask layer; and etching the structural layer using remaining portions of the mask layer as a mask for the etching of the structural layer forming a plurality of surface roughness features on a travel stop of the MEMS device. |
地址 |
Austin TX US |