| 摘要 |
PROBLEM TO BE SOLVED: To obtain a mapping device for semiconductor devices which enables effective use of a semiconductor device even if it has a unit at a fault spot, and can materialize a semiconductor device whose design of a desired function is easy. SOLUTION: A fault spot file generation means 110 generates a fault spot file 109 representing fault spots of units in a semiconductor device making them correspond to the semiconductor device. A mapping means 3 performs mapping of a plurality of units without using the units at the fault spots represented in the file 109. COPYRIGHT: (C)2008,JPO&INPIT
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