发明名称 半導体装置およびその製造方法
摘要 A semiconductor device is manufactured by using an SOI substrate having an insulating layer on a substrate and a semiconductor layer on the insulating layer. The semiconductor device is provided with a gate electrode formed on the semiconductor layer via a gate insulating film, a sidewall spacer formed on a sidewall of the gate electrode, a semiconductor layer for source/drain that is epitaxially grown on the semiconductor layer, and a sidewall spacer formed on a sidewall of the semiconductor layer.
申请公布号 JP5944266(B2) 申请公布日期 2016.07.05
申请号 JP20120178715 申请日期 2012.08.10
申请人 ルネサスエレクトロニクス株式会社 发明人 山本 芳樹;槇山 秀樹;岩松 俊明;角村 貴昭
分类号 H01L21/336;H01L21/28;H01L21/76;H01L29/786 主分类号 H01L21/336
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