发明名称 基板載置台及びプラズマ処理装置
摘要 A substrate mounting table (94) is equipped with a mounting table (2), an electrostatic chuck (6), and a bevel covering (5). The electrostatic chuck (6) has a supporting surface (6e) which is in contact with the whole of the rear surface of a wafer (W). The annular bevel covering (5) has an outer diameter (DA) which is greater than that of the supporting surface (6e), and an inner diameter (DI) which is smaller than that of the wafer (W). The bevel covering (5) is disposed such that, when viewed from the direction orthogonal to the supporting surface (6e), the bevel covering (5) surrounds the periphery of the wafer (W) supported on the supporting surface (6e).
申请公布号 JP6055783(B2) 申请公布日期 2016.12.27
申请号 JP20130554291 申请日期 2013.01.15
申请人 東京エレクトロン株式会社 发明人 羽藤 秀幸;土場 重樹;山本 真也;山田 哲史;森 広斗;安藤 健二
分类号 H01L21/3065;H01L21/683;H05H1/46 主分类号 H01L21/3065
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