发明名称 MICROWAVE OVEN ABNORMAL STATE DETECTING DEVICE AND METHOD OF DETECTING ABNORMAL STATE OF MICROWAVE OVEN
摘要 PURPOSE: A microwave oven abnormal state detecting device is capable of monitoring either an unloaded state of a cooking chamber or an overheating of a magnetron or a cooking chamber by the use of a voltage applied to both terminals of the magnetron. CONSTITUTION: The microwave oven abnormal state detection device includes a noise filter(10), relays(RY21,RY22), magnetron(30), and high voltage transformer(20). The device includes a voltage sensing part(60) connected between the high voltage transformer and the magnetron to sense a voltage applied to both terminals of the magnetron; and a control part(50) receiving the voltage between both the terminals of the magnetron from the voltage sensing part to determine an unloaded state where nothing is in the cooking chamber or an overheated state of the magnetron or the cooking chamber, and when determining that the microwave oven is in the abnormal state, turning off the relays to stop the operation of the magnetron. Thereby, the device prevents damage to the oven's internal components or various dangerous troubles that may occur when the abnormal state is left unsettled for a long period of time.
申请公布号 KR20000009937(A) 申请公布日期 2000.02.15
申请号 KR19980030624 申请日期 1998.07.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, WON WOO
分类号 H05B6/68;F24C7/02;H05B6/64;H05B6/66;(IPC1-7):H05B6/64 主分类号 H05B6/68
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