发明名称 |
ELECTRICAL CONNECTION DEVICE |
摘要 |
<p>An electrical connection device used for electrical measurement of an object to be inspected has a support member and a planar probe substrate. On one side of the probe substrate, there are provided a large number of probes that are in contact with electrical connection terminals of the object to be electrically inspected. On the other side of the probe substrate, there are provided a fixation portion having in its top a screw hole opening, a tubular spacer penetrating through the support member, and a threaded member penetrating through the spacer and whose forward end is screwed into the screw hole in the fixed portion. Movement of the spacer in the axial direction of the support member is restricted by restriction means. The spacer has a head portion mounted at its lower surface on the other side of the support member, and also has a trunk. The trunk has one end continuous to the head portion, is inserted into a through hole formed in the support member, and has the other end made to be in contact with the top surface of the fixation portion.</p> |
申请公布号 |
WO2008114464(A1) |
申请公布日期 |
2008.09.25 |
申请号 |
WO2007JP56518 |
申请日期 |
2007.03.20 |
申请人 |
KABUSHIKI KAISHA NIHON MICRONICS;MIURA, KIYOTOSHI;SATO, HITOSHI;AKAHIRA, AKIHISA |
发明人 |
MIURA, KIYOTOSHI;SATO, HITOSHI;AKAHIRA, AKIHISA |
分类号 |
G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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