发明名称 METHOD FOR FORMING A SEMICONDUCTOR DEVICE HAVING A FIN CHANNEL TRANSISTOR
摘要 The semiconductor device includes a device isolation structure formed in a semiconductor substrate to define an active region having a recess region at a lower part of sidewalls thereof. The semiconductor device additionally has a fin channel region protruded over the device isolation structure in a longitudinal direction of a gate region; a gate insulating film formed over the semiconductor substrate including the protruded fin channel region; and a gate electrode formed over the gate insulating film to fill up the protruded fin channel region.
申请公布号 US2010022057(A1) 申请公布日期 2010.01.28
申请号 US20090569802 申请日期 2009.09.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHUNG SUNG WOONG;LEE SANG DON
分类号 H01L21/762;H01L21/28;H01L21/8242 主分类号 H01L21/762
代理机构 代理人
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