METHOD FOR INSPECTING SUBSTRATE AND SUBSTRATE USING THE SAME

摘要

The present invention relates to a method for inspecting a substrate and the substrate using the same. The method comprises: a step of forming a substrate having an opened loop-type conductive pattern along with a peripheral part on a surface of a substrate body; a step of measuring a resistance value of the conductive pattern by contacting a resistance measuring means to opened both ends of the conductive pattern; and a step of determining whether the substrate is defective according to the size of the resistance value. According to the present invention, a user is able to clearly detect whether a substrate is cracked with a simple structure.