On-Chip Circuit and Method for Accurately Measuring Die Temperature of an Integrated Circuit

摘要

An integrated circuit and method are provided for accurately measuring the temperature of a die of the integrated circuit. Pairs of diodes are driven with different currents in order to generate a series of thermal voltages. The ADC measures the series of thermal voltages against an external reference voltage. Based on these thermal voltage measurements, the ADC calculates the die temperature. The different currents used to generate the series of thermal voltages are selected at specific ratios to each other in order to promote the ability of the ability of the ADC to calculate the die temperature using standard components and logic of an ADC. These thermal voltages are generated and measured using integrated components of the die for which a temperature measurement is being provided, thus reducing several sources of inaccuracies in conventional die temperature measurement techniques. Addition embodiments are provided for detecting defective diodes based on comparisons of the thermal voltage outputs.

主权项

1. A temperature sensor integrated circuit comprising:
a die; a thermal voltage source operable to generate pairs of the thermal voltages, wherein each of the pair of thermal voltages varies with the temperature of the die, and wherein the thermal voltage source is a component of the die; and an ADC operable to receive an external reference voltage provided as an input to the temperature sensor integrated circuit and further operable to receive the pairs of thermal voltages; wherein the ADC is further operable to calculate a PTAT voltage based on pairs of thermal voltages and an external reference voltage, and wherein the ADC is a component of the die.