发明名称 MIXED MODE PULSING ETCHING IN PLASMA PROCESSING SYSTEMS
摘要 A method for processing substrate in a chamber, which has at least one plasma generating source, a reactive gas source for providing reactive gas into the interior region of the chamber, and a non-reactive gas source for providing non-reactive gas into the interior region, is provided. The method includes performing a mixed-mode pulsing (MMP) preparation phase, including flowing reactive gas into the interior region and forming a first plasma to process the substrate that is disposed on a work piece holder. The method further includes performing a MMP reactive phase, including flowing at least non-reactive gas into the interior region, and forming a second plasma to process the substrate, the second plasma is formed with a reactive gas flow during the MMP reactive phase that is less than a reactive gas flow during the MMP preparation phase. Perform the method steps a plurality of times.
申请公布号 SG10201608686T(A) 申请公布日期 2016.12.29
申请号 SGT10201608686 申请日期 2012.12.17
申请人 LAM RESEARCH CORPORATION 发明人 JACOBS KANARIK KEREN
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