DEFECTIVE KEY EXAMINING AND PROCESSING METHOD OF MICROWAVE OVEN

摘要

PURPOSE: A defective key examining and processing method of a microwave oven is provided to indicate that the current key is in a state of short error if a voluntary key is continuously pressed during a certain time in a key matrix. CONSTITUTION: The defective key examining and processing method of a microwave oven includes the steps of:judging if the key signal inputted through a key matrix is a defective key; judging if the current inputted key value is continuously pressed the same as the previous stored key value if the inputted key is judged as a normal key; and newly storing the input key value as the current inputted key value and eliminating the former value if judged the inputted key value is not continuously pressed the same as the previous stored key value.