发明名称 |
METHOD FOR DIAGNOSING DEGRADATION OF DC/AC INVERTER AND DC/AC RECTIFIER, ESPECIALLY MAXIMIZING FACILITY OPERATION EFFICIENCY |
摘要 |
PURPOSE: A method for diagnosing degradation of a DC/AC inverter and a DC/AC rectifier is provided to judge the amount of degradation and replacement time by measuring electrical characteristics change according to the degradation of a power semiconductor device. CONSTITUTION: According to the method for diagnosing degradation of a DC/AC inverter and a DC/AC rectifier during operation, an input/output voltage and an input/output current of an arm comprising a plurality of power semiconductor devices are measured in a corresponding DC/AC inverter and a corresponding DC/AC rectifier during their operation(S12). A parameter value of an average switch model is calculated by the measurement value as to the input/output voltage and current of the arm(S13). The state of the degradation process of the power semiconductor device is judged according to the variation of the parameter value(S14).
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申请公布号 |
KR20050017735(A) |
申请公布日期 |
2005.02.23 |
申请号 |
KR20030054893 |
申请日期 |
2003.08.08 |
申请人 |
KOREA ELECTRO TECHNOLOGY RESEARCH INSTITUTE |
发明人 |
CHOI, YOUNG KIL;CHUNG, JAE HO;JO, KI YEON;KOO, TAE GEUN |
分类号 |
G01R31/12;(IPC1-7):G01R31/12 |
主分类号 |
G01R31/12 |
代理机构 |
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