发明名称 METHOD FOR DIAGNOSING DEGRADATION OF DC/AC INVERTER AND DC/AC RECTIFIER, ESPECIALLY MAXIMIZING FACILITY OPERATION EFFICIENCY
摘要 PURPOSE: A method for diagnosing degradation of a DC/AC inverter and a DC/AC rectifier is provided to judge the amount of degradation and replacement time by measuring electrical characteristics change according to the degradation of a power semiconductor device. CONSTITUTION: According to the method for diagnosing degradation of a DC/AC inverter and a DC/AC rectifier during operation, an input/output voltage and an input/output current of an arm comprising a plurality of power semiconductor devices are measured in a corresponding DC/AC inverter and a corresponding DC/AC rectifier during their operation(S12). A parameter value of an average switch model is calculated by the measurement value as to the input/output voltage and current of the arm(S13). The state of the degradation process of the power semiconductor device is judged according to the variation of the parameter value(S14).
申请公布号 KR20050017735(A) 申请公布日期 2005.02.23
申请号 KR20030054893 申请日期 2003.08.08
申请人 KOREA ELECTRO TECHNOLOGY RESEARCH INSTITUTE 发明人 CHOI, YOUNG KIL;CHUNG, JAE HO;JO, KI YEON;KOO, TAE GEUN
分类号 G01R31/12;(IPC1-7):G01R31/12 主分类号 G01R31/12
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