发明名称 |
Semiconductor device having a lower diode region arranged below a trench |
摘要 |
A semiconductor device includes a semiconductor body and at least one device cell integrated in the semiconductor body. Each device cell includes: a drift region, a source region, and a body region arranged between the source and drift regions; a diode region and a pn junction between the diode and drift regions; a trench having a first sidewall, a second sidewall opposite the first sidewall, and a bottom, the body region adjoining the first sidewall, the diode region adjoining the second sidewall, and the pn junction adjoining the bottom; a gate electrode in the trench and dielectrically insulated from the body, diode and drift regions by a gate dielectric. The diode region has a lower diode region arranged below the trench bottom, and the lower diode region has a maximum of a doping concentration distant to the trench bottom. A corresponding method of manufacturing the device also is provided. |
申请公布号 |
US9478655(B2) |
申请公布日期 |
2016.10.25 |
申请号 |
US201514718443 |
申请日期 |
2015.05.21 |
申请人 |
Infineon Technologies AG |
发明人 |
Siemieniec Ralf;Bergner Wolfgang;Esteve Romain;Peters Dethard |
分类号 |
H01L29/15;H01L31/0312;H01L29/78;H01L29/16;H01L29/66;H01L29/167;H01L21/04;H01L29/423;H01L29/04;H01L29/861;H01L29/06 |
主分类号 |
H01L29/15 |
代理机构 |
Murphy, Bilak & Homiller, PLLC |
代理人 |
Murphy, Bilak & Homiller, PLLC |
主权项 |
1. A semiconductor device, comprising a semiconductor body and at least one device cell integrated in the semiconductor body, the at least one device cell comprising:
a drift region, a source region, and a body region arranged between the source region and the drift region; a diode region and a pn junction between the diode region and the drift region; a trench with a first sidewall, a second sidewall opposite the first sidewall, and a bottom, the body region adjoining the first sidewall, the diode region adjoining the second sidewall, and the pn junction adjoining the bottom of the trench; a gate electrode arranged in the trench and dielectrically insulated from the body region, the diode region and the drift region by a gate dielectric; wherein the diode region comprises a lower diode region arranged below the bottom of the trench; and wherein the lower diode region has a maximum of a doping concentration distant to the bottom of the trench. |
地址 |
Neubiberg DE |