| 发明名称 |
MEASUREMENT SYSTEM UTILIZING A SENSOR FORMED ON A SILICON ON INSULATOR STRUCTURE |
| 摘要 |
<p>A measurement system utilizes a sensor formed in a semiconductor on insulator structure that has an offset related to the time that power is applied. A controller applies power, obtains readings and removes power so as to minimize any effect of the offset.</p> |
| 申请公布号 |
EP1166046(A1) |
申请公布日期 |
2002.01.02 |
| 申请号 |
EP20000916088 |
申请日期 |
2000.03.03 |
| 申请人 |
HONEYWELL INC. |
发明人 |
VOEGELE, KEVIN, D.;STRATTON, THOMAS, G.;JOHNSON, RUSSELL, L. |
| 分类号 |
G01L9/00;G01D3/028;G01D18/00;G01D21/00;G01L1/22;G01L9/02;G01L9/04;G01L9/12;(IPC1-7):G01D3/02 |
主分类号 |
G01L9/00 |
| 代理机构 |
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