发明名称 Process for forming high temperature stable self-aligned metal silicide layer
摘要 A process for forming high temperature stable self-aligned silicide layer that not only establishes itself smoothly and uniformly despite the use of a high temperature in the siliciding reaction, but also can withstand other subsequent high temperature thermal processing operations and maintaining a stable metal silicide layer profile thereafter. Moreover, desired thickness and uniformity of the metal silicide layer can be obtained by suitably adjusting the amorphous implant parameters, while the use of a titanium nitride cap layer help to stabilize the metal silicide layer during high temperature formation and that a stable and uniform metal silicide layer profile can be ensured even if subsequent high temperature processing operations are performed.
申请公布号 US6156633(A) 申请公布日期 2000.12.05
申请号 US19980034261 申请日期 1998.03.04
申请人 UNITED MICROELECTRONICS CORP. 发明人 PAN, HONG-TSZ;CHEN, TUNG-PO
分类号 H01L21/285;(IPC1-7):H01L21/44 主分类号 H01L21/285
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