发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a nitride semiconductor device which enables a stable operation in high-frequency operation and has favorable high-frequency properties.SOLUTION: A semiconductor device has: a buffer layer 21 provided on a substrate 10; a semiconductor layer which is provided on the buffer layer 21 and includes a co-doped region 22 and a high-resistance region 23; a carrier transit layer 31 provided on the semiconductor layer; a carrier supply layer 32 provided on the carrier transit layer 31; and a gate electrode 41, a source electrode 42 and a drain electrode 43 which are provided on the carrier supply layer 32. The co-doped region 22 is formed in a region between the gate electrode 41 and drain electrode 43 in plan view, and Si and at least one impurity element selected from Fe and C are doped. The high-resistance region 23 is formed in a region just below the gate electrode 41 and either of Fe of C is doped as an impurity element.SELECTED DRAWING: Figure 4
申请公布号 JP2016187024(A) 申请公布日期 2016.10.27
申请号 JP20150067618 申请日期 2015.03.27
申请人 FUJITSU LTD 发明人 KAMATA YOICHI
分类号 H01L21/338;H01L29/778;H01L29/812;H02M3/00 主分类号 H01L21/338
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