发明名称 Semiconductor memory device
摘要 A semiconductor memory device (100) having reduced logic gates for selecting sense amplifier columns (102-0 to 102-2) is disclosed. Sense amplifier columns (102-0 to 102-2) are selected according to block address values X5 to X0. The order in which sense amplifier columns (102-0 to 102-2) are selected corresponds to a gray code in the lower two significant block address values (X1 and X0). In this arrangement, X1 can be applied to a NAND gate 110-0 within sense amplifier selecting circuit 106-1 as predecoded signal C1. X0 can be applied to a NAND gate 110-1 within sense amplifier selecting circuit 106-2 as predecoded signal C2. The use of predecoded values (X0 and X1) instead of decoded values can reduce the logic required to select the sense amplifier columns (102-0 to 102-2).
申请公布号 US5986942(A) 申请公布日期 1999.11.16
申请号 US19990233701 申请日期 1999.01.19
申请人 NEC CORPORATION 发明人 SUGIBAYASHI, TADAHIKO
分类号 G11C7/06;(IPC1-7):G11C13/00 主分类号 G11C7/06
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