发明名称 異物検査装置、異物検査方法、異物検査プログラム
摘要 A foreign matter inspection device for inspecting foreign matter adhered to a sheet in a state in which a recess is formed on the sheet and a tablet is accommodated inside the recess, the foreign matter inspection device having an acquisition unit for acquiring a reflection image obtained by irradiating reflection light onto one surface of the sheet and imaging the reflection light and a transmission image obtained by irradiating transmission light onto the other surface of the sheet and imaging the transmission light and a determination unit for determining, if a foreign matter candidate that is either like matter that is of the same type as the tablet or foreign matter appears in the reflection image and the transmission image, whether the foreign matter candidate is like matter or foreign matter on the basis of the position of the foreign matter candidate appearing in the reflection image and transmission image and the color of the foreign matter candidate appearing in the reflection image.
申请公布号 JP5921704(B2) 申请公布日期 2016.05.24
申请号 JP20140542044 申请日期 2014.03.10
申请人 株式会社東芝;東芝ソリューション株式会社 发明人 奈良迫 祐介;佐藤 嘉隆;高橋 光憲
分类号 G01N21/892;B65B57/10;G01B11/00;G01N21/85;G06T7/00 主分类号 G01N21/892
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