发明名称 |
TRANSISTORS HAVING A GATE COMPRISING A TITANIUM NITRIDE LAYER AND METHOD FOR DEPOSITING THIS LAYER |
摘要 |
A MOS transistor having a gate insulator including a dielectric of high permittivity and a conductive layer including a TiN layer, wherein the nitrogen composition in the TiN layer is sub-stoichiometric in its lower portion and progressively increases to a stoichiometric composition in its upper portion.
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申请公布号 |
US2013001708(A1) |
申请公布日期 |
2013.01.03 |
申请号 |
US201213530621 |
申请日期 |
2012.06.22 |
申请人 |
CAUBET PIERRE;BAUDOT SYLVAIN |
发明人 |
CAUBET PIERRE;BAUDOT SYLVAIN |
分类号 |
H01L29/51;C23C14/34;H01L29/78 |
主分类号 |
H01L29/51 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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