DETECTION OF GENE MUTATION BY NANOPARTICLE-DNA CORONA COMPLEX AND AU OR SI SUBSTRATE VIA KELVIN PROBE FORCE MICROSCOPY

摘要

The present invention relates to a high-sensitive genetic mutation detection method based on a DNA-nanoparticle composite by an Au or Si substrate using Kelvin probe force microscopy (KPFM), more specifically, to a method which limits the kind of nanoparticles and substrates to optimize the surface potential measurement using the KPFM to detect the mutation of genes, and identifies the mutation of genes by fixing probe DNA to nanoparticles, spreading a compound hybridized with target DNA on an Au or Si substrate, and using the surface potential measured by the KPFM.