发明名称 PHOTODIODE GATE DIELECTRIC PROTECTION LAYER
摘要 The present disclosure relates to a method the present disclosure relates to an integrated chip having an active pixel sensor with a gate dielectric protection layer that reduces damage to an underlying gate dielectric layer during fabrication, and an associated method of formation. In some embodiments, the integrated chip has a photodetector disposed within a substrate, and a gate structure located over the substrate. A gate dielectric protection layer is disposed over the substrate and extends from along a sidewall of the gate structure to a location overlying the photodetector. The gate dielectric protection layer has an upper surface that is vertically below an upper surface of the gate structure.
申请公布号 US2016276384(A1) 申请公布日期 2016.09.22
申请号 US201615169994 申请日期 2016.06.01
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Chou Cheng-Hsien;Hsu Wen-I;Tsao Tsun-Kai;Lai Chih-Yu;Lu Jiech-Fun;Tu Yeur-Luen
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. An integrated chip, comprising: a photodetector disposed within a substrate; a gate structure located over the substrate; and a gate dielectric protection layer disposed over the substrate and extending from along a sidewall of the gate structure to a location overlying the photodetector, wherein the gate dielectric protection layer has an upper surface that is vertically below an upper surface of the gate structure.
地址 Hsin-Chu TW