ERROR DETECTION CIRCUIT AND SEMICONDUCTOR APPARATUS USING THE SAME

摘要

An error detection circuit may include a selection unit that sequentially selects a primary data group and a secondary data group according to a first control signal and generates an output signal; a first operation unit that performs an error detection operation on the output signal and outputs a preliminary error operation signal; a storage unit that latches the preliminary error operation signal and output a latched signal according to a second control signal; a second operation unit that performs an error detection operation on a previous preliminary error operation signal outputted from the storage unit and a current preliminary error operation signal outputted from the first operation unit and generates an internal error operation signal; and a comparison unit that compares the internal error operation signal with an external error operation signal and outputs a result of the comparison as an error detection signal.

主权项

1. An error detection circuit comprising:
a selection unit configured to sequentially select a primary data group and a secondary data group according to a first control signal, and generate an output signal; a first operation unit configured to perform an error detection operation on the output signal of the selection unit, and output a result of the error detection operation as a preliminary error operation signal; a storage unit configured to latch the preliminary error operation signal and output a latched signal according to a second control signal; a second operation unit configured to perform an error detection operation on a previous preliminary error operation signal outputted from the storage unit and a current preliminary error operation signal outputted from the first operation unit, and generate a result of the error detection operation as an internal error operation signal; and a comparison unit configured to compare the internal error operation signal with an external error operation signal, and output a result of the comparison as an error detection signal.