| 摘要 |
Employed is a probe support apparatus having: a base stand; an arm connected to an upper end of the base stand so that the arm can be tilted and rotated in a horizontal direction; and a probe support section connected to a distal end of the arm at a side opposite that of a portion connected to the base stand. The probe support section is constituted by a deformable section and a non-deformable section, and the non-deformable section is connected to a distal end of the arm so that the non-deformable section can rotate about an axis parallel to a rotation axis about which the arm is tilted. |
