| 摘要 |
A measurement error correcting method and electronic component characteristic measuring device capable of accurately coping with an electronic component which includes nonsignal line ports and whose electrical characteristics are changed by a jig. The method includes the steps of measuring an electrical characteristic, with correcting-data-acquisition samples mounted on a test jig enabling measuring nonsignal line ports, and the samples mounted on a reference jig in which nonsignal line ports cannot be measured; measuring a through device in which a signal line port and a nonsignal line port are electrically connected to each other, with the through device mounted on the test jig, and the through device mounted on the reference jig; determining a numerical expression for calculating, from results of measurement with the through device mounted on the test jig, an estimated electrical characteristic value obtained with the through device mounted on the reference jig; measuring an arbitrary electronic component, with the electronic component mounted on the test jig; and calculating the estimated electrical characteristic value obtained with the through device mounted on the reference jig.
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