摘要 |
PROBLEM TO BE SOLVED: To provide an integrated circuit element socket substrate not required to stop a tester, and switchable to a proper test circuit. SOLUTION: This socket substrate includes a substrate main body, is arranged with a plurality of test sockets in the substrate main body, tests an integrated circuit element of connecting a plurality of metal end points on an at least one integrated circuit element to be tested electrically to a bottom part of the socket substrate, via a plurality of conductive elements on the test sockets, and is arranged with the plurality of sets of test circuits, and at least one switch element, in the bottom part of each socket substrate, and the switch element can conduct switching between the plurality of sets of test circuits. COPYRIGHT: (C)2009,JPO&INPIT
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