发明名称 TESTING DEVICE HAVING SWITCHING ELEMENT ON SOCKET SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide an integrated circuit element socket substrate not required to stop a tester, and switchable to a proper test circuit. SOLUTION: This socket substrate includes a substrate main body, is arranged with a plurality of test sockets in the substrate main body, tests an integrated circuit element of connecting a plurality of metal end points on an at least one integrated circuit element to be tested electrically to a bottom part of the socket substrate, via a plurality of conductive elements on the test sockets, and is arranged with the plurality of sets of test circuits, and at least one switch element, in the bottom part of each socket substrate, and the switch element can conduct switching between the plurality of sets of test circuits. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009085934(A) 申请公布日期 2009.04.23
申请号 JP20070278983 申请日期 2007.10.26
申请人 KING YUAN ELECTRONICS CO LTD 发明人 TEI BUNKETSU
分类号 G01R31/28 主分类号 G01R31/28
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