发明名称 ELECTRIC FIELD ENHANCEMENT ELEMENT, AUTOMATIC ANALYZER AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an electric field enhancement element capable of efficiently measuring a target matter, which has many hot spots for absorbing the target matter.SOLUTION: The electric field enhancement element includes: a metal layer; plural filaments formed above the metal layer, which are disposed at a predetermined period; and plural nanostructures formed above the metal layer, which are disposed between the neighboring filaments in a plan view. Each of the nanostructure includes plural metal parts and dielectric parts, which has a structure in which plural metal parts are disposed being separated from each other by the dielectric part in a normal direction of the metal layer. Each of the metal parts is disposed at a position separated at a distance of 0.17-0.36 times of the period from a closer filament in the neighboring filaments.SELECTED DRAWING: Figure 1
申请公布号 JP2016197069(A) 申请公布日期 2016.11.24
申请号 JP20150077461 申请日期 2015.04.06
申请人 SEIKO EPSON CORP 发明人 ENARI MEGUMI
分类号 G01N21/65;G01N21/17;G01N21/41;G01N21/64 主分类号 G01N21/65
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