发明名称 ELECTRICAL CIRCUIT ODOMETER SENSOR ARRAY
摘要 Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of sensor groups. Each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective one of a plurality of failure mechanisms.
申请公布号 US2016178694(A1) 申请公布日期 2016.06.23
申请号 US201414574746 申请日期 2014.12.18
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Fry Jonathan R.;Klabes Christopher;Martin Andrew J.;McGahay Vincent J.;Schlichting Kathryn E.;Smith Melissa A.
分类号 G01R31/28;G01C22/00 主分类号 G01R31/28
代理机构 代理人
主权项 1. An on-chip sensor system, comprising: an integrated circuit chip comprising a plurality of sensor groups, wherein each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective one of a plurality of failure mechanisms.
地址 Armonk NY US