| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method which is easy to entrust an analysis related to the quality decision of a substrate to a serviceman on the outside, in forming image data using image parameters and inspecting the same to decide the quality thereof. SOLUTION: An image processing means 5 is constituted so that the common image parameter stored in a parameter memory means 9 is used when it is clarified on the basis of position data that a printing solder place of measuring data ready to be processed, is another printing solder place other than the specific printing solder place, and the individual image parameter stored in an individual parameter storing regions 9a is used, when the place is a specific printing solder place. The analysis data related only to the specific location decided by mistake by a deciding means 7 is output to the serviceman from an analyzing data output means 5 and the new image parameter value, sent as the analysis result from the serviceman is stored in the individual parameter memory region 9a. COPYRIGHT: (C)2005,JPO&NCIPI
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