发明名称 METHOD AND STRUCTURE OF FORMING FINFET ELECTRICAL FUSE STRUCTURE
摘要 An e-Fuse structure is provided on a surface of an insulator layer of a semiconductor-on-insulator substrate (SOI). The e-Fuse structure includes a first metal semiconductor alloy structure of a first thickness, a second metal semiconductor alloy structure of the first thickness, and a metal semiconductor alloy fuse link is located laterally between and connected to the first and second metal semiconductor alloy structures. The metal semiconductor alloy fuse link has a second thickness that is less than the first thickness.
申请公布号 US2016315049(A1) 申请公布日期 2016.10.27
申请号 US201514694306 申请日期 2015.04.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 He Hong;Li Juntao;Yang Chih-Chao;Yin Yunpeng
分类号 H01L23/525;H01L29/78;H01L27/12;H01L29/66 主分类号 H01L23/525
代理机构 代理人
主权项 1. A semiconductor structure comprising: an e-Fuse structure located on a surface of an insulator layer of a semiconductor-on-insulator substrate (SOI), said e-Fuse structure comprising a first metal semiconductor alloy structure of a first thickness and having a non-vertical outermost sidewall that slopes outward from a topmost surface to a bottommost surface, a second metal semiconductor alloy structure of said first thickness and having a non-vertical outermost sidewall surface that slopes outward from a topmost surface to a bottommost surface, and a metal semiconductor alloy fuse link having a non-planar upper surface and located laterally between and in direct physical contact with said non-vertical outermost sidewall of each of said first and second metal semiconductor alloy structures and having a second thickness that is less than said first thickness.
地址 Armonk NY US