发明名称 |
METHOD AND STRUCTURE OF FORMING FINFET ELECTRICAL FUSE STRUCTURE |
摘要 |
An e-Fuse structure is provided on a surface of an insulator layer of a semiconductor-on-insulator substrate (SOI). The e-Fuse structure includes a first metal semiconductor alloy structure of a first thickness, a second metal semiconductor alloy structure of the first thickness, and a metal semiconductor alloy fuse link is located laterally between and connected to the first and second metal semiconductor alloy structures. The metal semiconductor alloy fuse link has a second thickness that is less than the first thickness. |
申请公布号 |
US2016315049(A1) |
申请公布日期 |
2016.10.27 |
申请号 |
US201514694306 |
申请日期 |
2015.04.23 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
He Hong;Li Juntao;Yang Chih-Chao;Yin Yunpeng |
分类号 |
H01L23/525;H01L29/78;H01L27/12;H01L29/66 |
主分类号 |
H01L23/525 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor structure comprising:
an e-Fuse structure located on a surface of an insulator layer of a semiconductor-on-insulator substrate (SOI), said e-Fuse structure comprising a first metal semiconductor alloy structure of a first thickness and having a non-vertical outermost sidewall that slopes outward from a topmost surface to a bottommost surface, a second metal semiconductor alloy structure of said first thickness and having a non-vertical outermost sidewall surface that slopes outward from a topmost surface to a bottommost surface, and a metal semiconductor alloy fuse link having a non-planar upper surface and located laterally between and in direct physical contact with said non-vertical outermost sidewall of each of said first and second metal semiconductor alloy structures and having a second thickness that is less than said first thickness. |
地址 |
Armonk NY US |