发明名称 |
SEMICONDUCTOR DEVICES INCLUDING A CONTACT STRUCTURE AND METHODS OF MANUFACTURING THE SAME |
摘要 |
The semiconductor device may include an insulating interlayer on the substrate, the substrate including a contact region at an upper portion thereof, a main contact plug penetrating through the insulating interlayer and contacting the contact region, the main contact plug having a pillar shape and including a first barrier pattern and a first metal pattern, and an extension pattern surrounding on an upper sidewall of the main contact plug, the extension pattern including a barrier material. In the semiconductor device, an alignment margin between the contact structure and an upper wiring thereon may increase. Also, a short failure between the contact structure and the gate electrode may be reduced. |
申请公布号 |
US2016315045(A1) |
申请公布日期 |
2016.10.27 |
申请号 |
US201615016376 |
申请日期 |
2016.02.05 |
申请人 |
BAEK Jae-Jik;KWON Kee-Sang;PARK Sang-Jine;YOON Bo-Un |
发明人 |
BAEK Jae-Jik;KWON Kee-Sang;PARK Sang-Jine;YOON Bo-Un |
分类号 |
H01L23/528;H01L23/522;H01L23/532;H01L27/088 |
主分类号 |
H01L23/528 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
an insulating interlayer on a substrate, the substrate including a contact region at an upper portion thereof, a main contact plug through the insulating interlayer and in contact with the contact region of the substrate, the main contact plug having a pillar shape and including a first barrier pattern and a first metal pattern; and an extension pattern surrounding an upper sidewall of the main contact plug, the extension pattern including a barrier material. |
地址 |
Seongnam-si KR |