发明名称 SEMICONDUCTOR DEVICES INCLUDING A CONTACT STRUCTURE AND METHODS OF MANUFACTURING THE SAME
摘要 The semiconductor device may include an insulating interlayer on the substrate, the substrate including a contact region at an upper portion thereof, a main contact plug penetrating through the insulating interlayer and contacting the contact region, the main contact plug having a pillar shape and including a first barrier pattern and a first metal pattern, and an extension pattern surrounding on an upper sidewall of the main contact plug, the extension pattern including a barrier material. In the semiconductor device, an alignment margin between the contact structure and an upper wiring thereon may increase. Also, a short failure between the contact structure and the gate electrode may be reduced.
申请公布号 US2016315045(A1) 申请公布日期 2016.10.27
申请号 US201615016376 申请日期 2016.02.05
申请人 BAEK Jae-Jik;KWON Kee-Sang;PARK Sang-Jine;YOON Bo-Un 发明人 BAEK Jae-Jik;KWON Kee-Sang;PARK Sang-Jine;YOON Bo-Un
分类号 H01L23/528;H01L23/522;H01L23/532;H01L27/088 主分类号 H01L23/528
代理机构 代理人
主权项 1. A semiconductor device, comprising: an insulating interlayer on a substrate, the substrate including a contact region at an upper portion thereof, a main contact plug through the insulating interlayer and in contact with the contact region of the substrate, the main contact plug having a pillar shape and including a first barrier pattern and a first metal pattern; and an extension pattern surrounding an upper sidewall of the main contact plug, the extension pattern including a barrier material.
地址 Seongnam-si KR
您可能感兴趣的专利