发明名称 Scanning projective lensless microscope system
摘要 A scanning projective lensless microscope device comprises a specimen surface, a scanning illumination source with a light element, a light detector outside the specimen surface, and a processor. The scanning illumination source scans the light element to a plurality of scanning locations to provide illumination to an object on the specimen surface. The light detector samples a sequence of sub-pixel shifted projection object images corresponding to the plurality of scanning locations. The processor constructs a high resolution image of the object based on the sequence of sub-pixel shifted projection images and a motion vector of the projections at a plane of interest.
申请公布号 US9426429(B2) 申请公布日期 2016.08.23
申请号 US201113281287 申请日期 2011.10.25
申请人 California Institute of Technology 发明人 Zheng Guoan;Yang Samuel;Lee Seung Ah;Yang Changhuei
分类号 H04N7/18;G02B21/06;G02B21/36 主分类号 H04N7/18
代理机构 Weaver Austin Villeneuve & Sampson LLP 代理人 Martinez-Lemke Sheila;Weaver Austin Villeneuve & Sampson LLP
主权项 1. A scanning projective lensless microscope device, comprising: a specimen surface; an illumination source configured to provide illumination incident to a specimen located on the specimen surface, the illumination provided to the specimen from one side of the specimen surface, wherein the illumination is incident to the specimen at a plurality of illumination angles sequentially; a light detector configured to receive, from an opposite side of the specimen surface, illumination from the illumination source and passing through the specimen, wherein the light detector is further configured to sample a sequence of sub-pixel shifted projection images of the specimen while the specimen is being illuminated at the plurality of illumination angles sequentially, wherein each sub-pixel shifted projection image is sampled at a different sample time while the illumination source provides illumination at one of the illumination angles and each sub-pixel projection image is based on the illumination passing through the specimen; and a processor that constructs a high resolution image of the specimen using the sampled sequence of sub-pixel shifted projection images, wherein the scanning projective lensless microscope device does not have a lens in an illumination path between the illumination source and the specimen being imaged and does not have a lens in another illumination path between the specimen being imaged and the light detector.
地址 Pasadena CA US