发明名称 |
Integrated circuit manufacturing tool condition monitoring system and method |
摘要 |
A system and method for monitoring a process tool of an integrated circuit manufacturing system are disclosed. An exemplary method includes defining zones of an integrated circuit manufacturing process tool; grouping parameters of the integrated circuit manufacturing process tool based on the defined zones; and evaluating a condition of the integrated circuit manufacturing process tool based on the grouped parameters. |
申请公布号 |
US9349660(B2) |
申请公布日期 |
2016.05.24 |
申请号 |
US201113308644 |
申请日期 |
2011.12.01 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Tsai Po-Feng;Ho Chia-Tong;Wu Sunny;Wang Jo Fei;Mou Jong-I;Lin Chin-Hsiang |
分类号 |
G06F19/00;H01L21/66 |
主分类号 |
G06F19/00 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method comprising:
defining zones of an integrated circuit manufacturing process tool, such that each of the zones corresponds to one or more hardware components of the integrated circuit manufacturing process tool; for each of the zones, grouping a subset of parameters of the integrated circuit manufacturing process tool into the zone based on the corresponding one or more hardware components; collecting inline parameter data associated with the parameters via at least one sensor associated with the integrated circuit manufacturing tool; for each of the zones, performing principle component analysis on a portion of the inline parameter data associated with the respective subset of parameters of the zone, wherein the principle component analysis includes:
generating a probability mapping;utilizing the probability mapping to determine a set of principle components based on the portion of the inline parameter data; andreducing the set of principle components such that there are fewer principle components than parameters associated with the zone; and evaluating a condition of the integrated circuit manufacturing process tool based on the grouped parameters and the principle components of the principle component analysis. |
地址 |
Hsin-Chu unknown |