发明名称 THIN FILM DEVICE WITH PROTECTIVE LAYER
摘要 Embodiments of the invention include a method for fabricating a semiconductor device and the resulting structure. A substrate is provided. A plurality of metal portions are formed on the substrate, wherein the plurality of metal portions are arranged such that areas of the substrate remain exposed. A thin film layer is deposited on the plurality of metal portions and the exposed areas of the substrate. A dielectric layer is deposited, wherein the dielectric layer is in contact with portions of the thin film layer on the plurality of metal portions, and wherein the dielectric layer is not in contact with portions of the thin film layer on the exposed areas of the substrate such that one or more enclosed spaces are present between the thin film layer on the exposed areas of the substrate and the dielectric layer.
申请公布号 US2016172507(A1) 申请公布日期 2016.06.16
申请号 US201414571771 申请日期 2014.12.16
申请人 International Business Machines Corporation 发明人 Annunziata Anthony J.;Chen Ching-Tzu;Chudow Joel D.
分类号 H01L29/786;H01L29/06;H01L21/02;H01L21/283;H01L29/66;H01L29/24;H01L21/04;H01L51/05;H01L51/00;H01L21/441;H01L29/16;H01L29/20 主分类号 H01L29/786
代理机构 代理人
主权项
地址 Armonk NY US