发明名称 THIN-FILM TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME
摘要 According to one embodiment, a thin-film transistor comprises an oxide semiconductor layer formed on a part of a substrate, a first gate insulator film of a silicon dioxide film formed on the oxide semiconductor layer and by the CVD method with a silane-based source gas, a second gate insulator film of a silicon dioxide film formed on the first gate insulator film by the CVD method with a TEOS source gas, and a gate electrode formed on the second gate insulator film.
申请公布号 US2016172503(A1) 申请公布日期 2016.06.16
申请号 US201615051786 申请日期 2016.02.24
申请人 Japan Display Inc. 发明人 HIRAMATSU Masato;FUCHI Masayoshi;ISHIDA Arichika
分类号 H01L29/786;H01L21/443;H01L29/66;H01L29/24 主分类号 H01L29/786
代理机构 代理人
主权项 1. A method for manufacturing a thin-film transistor comprising: forming an oxide semiconductor layer on a part of a substrate; forming a gate insulator film of a silicon dioxide film on the oxide semiconductor layer and the substrate by performing a surface treatment with oxygen plasma and by forming a film by the CVD method with a TEOS source gas; and forming a gate electrode on the gate insulator film.
地址 Minato-ku JP