发明名称 |
DESIGNED-BASED INTERCONNECT STRUCTURE IN SEMICONDUCTOR STRUCTURE |
摘要 |
Semiconductor structures are provided. The semiconductor structure includes a plurality of gate structures extending in a first direction formed over a substrate. The gate structures follow the following equation:;0.2Pgatemin+0.35Lgatemin+0.3Hgatemin-200.2Lgatemin+0.8Hgatemin-5×0.3Lgatemin+0.3Hgatemin+538≤0.32;Pgate min is the minimum value among gate pitches of the gate structures, and Lgate min is the minimum value among gate lengths of the gate structures. Hgate min is the minimum value among gate heights of the gate structures. |
申请公布号 |
US2016172297(A1) |
申请公布日期 |
2016.06.16 |
申请号 |
US201615050087 |
申请日期 |
2016.02.22 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHEN Chih-Liang;LAI Chih-Ming;YEN Yung-Sung;SIO Kam-Tou;OU Tsong-Hua;CHEN Chun-Kuang;LIU Ru-Gun;SUNG Shu-Hui;YOUNG Charles Chew-Yuen |
分类号 |
H01L23/528;H01L27/118;H01L27/02;H01L23/522 |
主分类号 |
H01L23/528 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor structure, comprising:
a plurality of gate structures extending in a first direction formed over a substrate, wherein the gate structures follow the following equation:0.2Pgatemin+0.35Lgatemin+0.3Hgatemin-200.2Lgatemin+0.8Hgatemin-5×0.3Lgatemin+0.3Hgatemin+538≤0.32 wherein Pgate min is the minimum value among gate pitches of the gate structures; Lgate min is the minimum value among gate lengths of the gate structures; and Hgate min is the minimum value among gate heights of the gate structures. |
地址 |
Hsinchu TW |