发明名称 FINFET STRUCTURE AND METHOD FOR MANUFACTURING THEREOF
摘要 The present invention provides a FinFET structure including a fin and a gate surrounding a first portion of the fin. A dopant concentration of the first portion of the fin is lower than 1E17/cm^3. The FinFET structure comprises an insulation layer surrounding a second portion of the fin. A dopant concentration of the second portion of the fin is higher than 8E15/cm^3. The insulation layer comprises a lower layer and an upper layer. The lower layer is arranged on a substrate connected to the fin. The lower layer has a dopant concentration higher than 1E19/cm^3.
申请公布号 KR20160089837(A) 申请公布日期 2016.07.28
申请号 KR20150034987 申请日期 2015.03.13
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 TSAI CHUN HSIUNG;CHONG LAI WAN;LEE CHIEN WEI;CHEN KEI WEI
分类号 H01L29/78 主分类号 H01L29/78
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