发明名称 |
FINFET STRUCTURE AND METHOD FOR MANUFACTURING THEREOF |
摘要 |
The present invention provides a FinFET structure including a fin and a gate surrounding a first portion of the fin. A dopant concentration of the first portion of the fin is lower than 1E17/cm^3. The FinFET structure comprises an insulation layer surrounding a second portion of the fin. A dopant concentration of the second portion of the fin is higher than 8E15/cm^3. The insulation layer comprises a lower layer and an upper layer. The lower layer is arranged on a substrate connected to the fin. The lower layer has a dopant concentration higher than 1E19/cm^3. |
申请公布号 |
KR20160089837(A) |
申请公布日期 |
2016.07.28 |
申请号 |
KR20150034987 |
申请日期 |
2015.03.13 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
TSAI CHUN HSIUNG;CHONG LAI WAN;LEE CHIEN WEI;CHEN KEI WEI |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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