| 摘要 |
A measurement device 1 for measuring a circumferential surface profile of a wheel 6 comprises a base 2 mounted at a position axially and radially fixed relative to the rotation axis of the wheel 6 and a probe 8a-c ending in a measurement head 10a-c. Measurement head 10a-c measures the radial position of a location on the surface profile relative to the rotation axis. Rotation of probe 8a-c relative to the wheel 6 allows it to detect variation in the measured radial position with distance around the surface profile. Base 2 may be removable such that the device can measure surface profiles of different wheels. Measurement head 10a-c may measure surface profiles of different diameters and/or may move in the axial direction relative to the base 2. Measurement head 10a-c may be contactless or may be a contact head biased to keep it in contact with the surface profile. There may be a reference probe 8b which measures the radial position of a location on the surface profile relative to the rotation axis and may be rotatably fixed relative to the wheel axis 4. There may be a recorder and/or a transmitter. There may be a processor calculating wavelengths of surface roughness around the surface profile from the detected variation in radial position. This device may be used on a wheel of a railway vehicle during maintenance related monitoring. |
