发明名称 OFDR DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide an optical frequency domain reflectometry (OFDR) device and method with which it is possible to measure large strain distribution or temperature distribution in a narrow measurement wavelength range using a fiber bragg grating (FBG).SOLUTION: An optical fiber 13 to be measured includes a plurality of overlapping-disposed FBGs 131a, 131b differing in reflection wavelength and the respective peak wavelengths of which change almost maintaining intervals in according with strain in the optical fiber, and an out-of-measurement range detection part 26 detects, on the basis of out-of-measurement range detection condition data Ds including the strain vs. peak wavelength or temperature change vs. peak wavelength characteristic of each of the overlapping-disposed FBGs 131a, 131b, a strain or temperature-including strain or temperature change range of the optical fiber to be measured or an overlapping-disposed FBG the reflection wavelength of which is out of a measurement wavelength range. An OFDR device 1 measures the strain distribution or temperature distribution of the optical fiber 13 to be measured on the basis of the strain or temperature change range or the overlapping-disposed FBG the reflection wavelength of which is out of the measurement wavelength range.SELECTED DRAWING: Figure 1
申请公布号 JP2016153768(A) 申请公布日期 2016.08.25
申请号 JP20150032227 申请日期 2015.02.20
申请人 ANRITSU CORP 发明人 MORI TAKASHI
分类号 G01B11/16;G01D5/353;G01K11/32 主分类号 G01B11/16
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