发明名称 METHOD FOR DOPING AN ACTIVE HALL EFFECT REGION OF A HALL EFFECT DEVICE AND HALL EFFECT DEVICE HAVING A DOPED ACTIVE HALL EFFECT REGION
摘要 Methods for doping an active Hall effect region of a Hall effect device in a semiconductor substrate, and Hall effect devices having a doped active Hall effect region are provided. A method includes forming a first doping profile of a first doping type in a first depth region of the active Hall effect region by means of a first implantation with a first implantation energy level, forming a second doping profile of the first doping type in a second depth region of the active Hall effect region by means of a second implantation with a second implantation energy level, and forming an overall doping profile of the active Hall effect region by annealing the semiconductor substrate with the active Hall effect region having the first and the second doping profile.
申请公布号 US2016268498(A1) 申请公布日期 2016.09.15
申请号 US201615069370 申请日期 2016.03.14
申请人 Infineon Technologies AG 发明人 ECKINGER Markus;KOLB Stefan
分类号 H01L43/04;G01R33/00;G01R33/07;H01L43/06;H01L43/14 主分类号 H01L43/04
代理机构 代理人
主权项 1. A method for doping an active Hall effect region of a Hall effect device in a semiconductor substrate, the method comprising: forming a first doping profile of a first doping type in a first depth region of the active Hall effect region by means of a first implantation with a first implantation energy level; forming a second doping profile of the first doping type in a second depth region of the active Hall effect region by means of a second implantation with a second implantation energy level; and forming an overall doping profile of the active Hall effect region by annealing the semiconductor substrate with the active Hall effect region having the first and second doping profile.
地址 Neubiberg DE