发明名称 IDENTIFYING A CONFIGURATION ELEMENT VALUE AS A POTENTIAL CAUSE OF A TESTING OPERATION FAILURE
摘要 Examples disclosed herein relate to identifying a configuration element value as a potential cause of a testing operation failure. Examples include causing a testing operation to be performed approximately in parallel on each of a plurality of instances of an application executed in respective testing environments, acquiring configuration element values from each of the testing environments, and identifying at least one of the configuration element values as a potential cause of a testing operation failure.
申请公布号 US2016283355(A1) 申请公布日期 2016.09.29
申请号 US201315035053 申请日期 2013.11.15
申请人 HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP 发明人 Shani Inbar;Nuriel Roy;Nitsan Amichai
分类号 G06F11/36 主分类号 G06F11/36
代理机构 代理人
主权项 1. A non-transitory machine-readable storage medium comprising instructions executable by a processing resource to: cause a testing operation to be performed approximately in parallel on each of a plurality of instances of an application, each instance executed in a respective one of a plurality of testing environments having different configurations from one another; acquire, from each of the testing environments, configuration element values for the testing environment, the values defining the configuration of the testing environment; determine that the testing operation failed at a given one of the testing environments; and in response to the determination, identify at least one of the configuration element values for the given testing environment as a potential cause of the testing operation failure based on differences between the configuration element values for the different testing environments.
地址 Houston TX US
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