发明名称 DUAL SOURCE XRF SYSTEM
摘要 A dual source tube XRF system and method wherein a first x-ray source is employed to direct x-rays in a first energy band at a sample and at least a second x-ray source is employed to direct x-rays in a second energy band at the sample. A detector is responsive to x-rays emitted by the sample after irradiation by the first and second x-ray sources. An analyzer is responsive to the detector and is configured to determine the amount of at least a first substance in the sample based on irradiation of the sample by the first x-ray source and to determine the amount of at least a second substance in the sample based on irradiation of the sample by the second x-ray source. A controller is responsive to the analyzer and is configured to energize the first and second x-ray sources either simultaneously or sequentially.
申请公布号 WO2008085500(A2) 申请公布日期 2008.07.17
申请号 WO2007US26376 申请日期 2007.12.26
申请人 INNOV-X-SYSTEMS, INC.;HUBBARD-NELSON, BRADLEY;HARDMAN, PETER, JOHN 发明人 HUBBARD-NELSON, BRADLEY;HARDMAN, PETER, JOHN
分类号 G01N23/223 主分类号 G01N23/223
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