发明名称 CHEMICAL MECHANICAL POLISHING COMPOSITION FOR METAL CIRCUIT COMPRISING ALUMINIUM HYDROXIDE
摘要 Provided is a chemical mechanical polishing composition for a metal wiring which is excellent in particle stability and dispersion stability, is lowered in density and reduces scratch, dishing and erosion. The chemical mechanical polishing composition comprises 0.1-30 wt% of an aluminum hydroxide abrasive; and 0.2-5 wt% of a chelating agent. Preferably the aluminum hydroxide abrasive has a density of 2.4-3.5 g/cm^3 and a Mohs hardness of 2.5-7 Mohs; and the chelating agent is selected from the group consisting of ammonium oxalate, tartaric acid, nitrilotriacetic acid, aminodiacetic aid, carboxylic acid amine, aminoacetic acid and ammonium citrate.
申请公布号 KR20070000576(A) 申请公布日期 2007.01.03
申请号 KR20050056030 申请日期 2005.06.28
申请人 SAMSUNG CORNING CO., LTD. 发明人 JEONG, JAE IN;LEE, YOON GYU;HYUN, HONG SEOB;SONG, MYUNG GEUN;KOO, JA HO
分类号 C09K3/14 主分类号 C09K3/14
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