发明名称 |
CHEMICAL MECHANICAL POLISHING COMPOSITION FOR METAL CIRCUIT COMPRISING ALUMINIUM HYDROXIDE |
摘要 |
Provided is a chemical mechanical polishing composition for a metal wiring which is excellent in particle stability and dispersion stability, is lowered in density and reduces scratch, dishing and erosion. The chemical mechanical polishing composition comprises 0.1-30 wt% of an aluminum hydroxide abrasive; and 0.2-5 wt% of a chelating agent. Preferably the aluminum hydroxide abrasive has a density of 2.4-3.5 g/cm^3 and a Mohs hardness of 2.5-7 Mohs; and the chelating agent is selected from the group consisting of ammonium oxalate, tartaric acid, nitrilotriacetic acid, aminodiacetic aid, carboxylic acid amine, aminoacetic acid and ammonium citrate.
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申请公布号 |
KR20070000576(A) |
申请公布日期 |
2007.01.03 |
申请号 |
KR20050056030 |
申请日期 |
2005.06.28 |
申请人 |
SAMSUNG CORNING CO., LTD. |
发明人 |
JEONG, JAE IN;LEE, YOON GYU;HYUN, HONG SEOB;SONG, MYUNG GEUN;KOO, JA HO |
分类号 |
C09K3/14 |
主分类号 |
C09K3/14 |
代理机构 |
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