发明名称 |
CIRCUIT FOR MEASURING VOLTAGE DROP, SEMICONDUCTOR DEVICE AND SYSTEM HAVING THE SAME, AND METHOD OF MEASURING THE VOLTAGE DROP |
摘要 |
A circuit for measuring a voltage drop, a semiconductor device and system including the same, and a method for measuring a voltage drop are provided to detect a voltage drop of a power voltage by detecting a voltage drop after comparing a sensed voltage with a reference voltage. A circuit for measuring a voltage drop includes a sensing circuit and a voltage drop detection circuit(120). The sensing circuit senses a voltage drop due to a resistance of a power line, and generates a sensing voltage. The voltage drop detection circuit detects a voltage drop by comparing the sensing voltage with a reference voltage, generates a detection signal, and includes a reference voltage generating circuit(121) and a comparison circuit(122). The reference voltage generating circuit is coupled between a first power voltage and a ground voltage, and generates the reference voltage. The comparison circuit generates the detection signal by comparing the sensing voltage and the reference voltage.
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申请公布号 |
KR20090028193(A) |
申请公布日期 |
2009.03.18 |
申请号 |
KR20070093609 |
申请日期 |
2007.09.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, CHEON OH;KIM, NAM HYUN;CHOI, DONG CHUL |
分类号 |
G11C5/14 |
主分类号 |
G11C5/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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