发明名称 CIRCUIT FOR MEASURING VOLTAGE DROP, SEMICONDUCTOR DEVICE AND SYSTEM HAVING THE SAME, AND METHOD OF MEASURING THE VOLTAGE DROP
摘要 A circuit for measuring a voltage drop, a semiconductor device and system including the same, and a method for measuring a voltage drop are provided to detect a voltage drop of a power voltage by detecting a voltage drop after comparing a sensed voltage with a reference voltage. A circuit for measuring a voltage drop includes a sensing circuit and a voltage drop detection circuit(120). The sensing circuit senses a voltage drop due to a resistance of a power line, and generates a sensing voltage. The voltage drop detection circuit detects a voltage drop by comparing the sensing voltage with a reference voltage, generates a detection signal, and includes a reference voltage generating circuit(121) and a comparison circuit(122). The reference voltage generating circuit is coupled between a first power voltage and a ground voltage, and generates the reference voltage. The comparison circuit generates the detection signal by comparing the sensing voltage and the reference voltage.
申请公布号 KR20090028193(A) 申请公布日期 2009.03.18
申请号 KR20070093609 申请日期 2007.09.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, CHEON OH;KIM, NAM HYUN;CHOI, DONG CHUL
分类号 G11C5/14 主分类号 G11C5/14
代理机构 代理人
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